Tous les ebooks de la collection "Integrated Circuits and Systems" - Springer


29  résultat(s)
Télécharger le livre :  Ultra-Low Voltage Nano-Scale Memories
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Ultra-Low Voltage Nano-Scale Memories


Masashi Horiguchi , Kiyoo Itoh , Hitoshi Tanaka


Ultra-Low Voltage Nano-Scale Memories provides an in-depth discussion of the state-of-the-art nanometer and sub-1-V memory LSIs that are playing decisive roles in power conscious systems. Emerging problems between the device, circuit, and system levels are...

Parution : 2007-09-04
Format(s) : PDF
Éditeur : Springer
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105,49
Télécharger le livre :  Modern Circuit Placement
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Modern Circuit Placement


Jingsheng Jason Cong , Gi-Joon Nam


Modern Circuit Placement: Best Practices and Results describes advanced techniques in VLSI circuit placement which is one of the most important steps of the VLSI physical design flow. Physical design addresses the back-end layout stage of the chip design process. As...

Parution : 2007-08-26
Format(s) : PDF
Éditeur : Springer
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147,69
Télécharger le livre :  Low Power Methodology Manual
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Low Power Methodology Manual


Rob Aitken , David Flynn , Alan Gibbons , Kaijian Shi


“Tools alone aren't enough to reduce dynamic and leakage power in complex chip designs - a well-planned methodology is needed. Following in the footsteps of the successful Reuse Methodology Manual (RMM), authors from ARM and Synopsys have written this Low Power...

Parution : 2007-07-31
Format(s) : PDF
Éditeur : Springer
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137,14
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A Practical Introduction to PSL


Cindy Eisner , Dana Fisman


Functional veri?cation is hard. Period. No disagreement here. But why is this so? Consider today’s design ?ow: much of it is more or less automated, from RTL to netlist to layout to silicon. But all this automation depends upon having correct RTL input to start with,...

Parution : 2007-06-19
Format(s) : PDF
Éditeur : Springer
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147,69
Télécharger le livre :  Design for Manufacturability and Yield for Nano-Scale CMOS
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Design for Manufacturability and Yield for Nano-Scale CMOS


Charles Chiang , Jamil Kawa


Design for Manufacturability and Yield for Nano-Scale CMOS walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process and how to address each aspect at the proper design step starting with the design and layout of standard cells and...

Parution : 2007-06-15
Format(s) : PDF
Éditeur : Springer
J'achète
94,94
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SAT-Based Scalable Formal Verification Solutions


Malay Ganai , Aarti Gupta


Functional verification has become an important aspect of the chip design process. Significant resources, both in industry and academia, are devoted to the design complexity and verification endeavors. SAT-Based Scalable Formal Verification Solutions discusses in...

Parution : 2007-05-26
Format(s) : PDF
Éditeur : Springer
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105,49
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CMOS Biotechnology


Donhee Ham , Hakho Lee , Robert M. Westervelt


CMOS Biotechnology reviews the recent research and developments joiningCMOS technology with biology. Written by leading researchers these chapters delve into four areas including: Microfluidics for electrical engineers CMOS Actuators CMOS Electrical...

Parution : 2007-05-04
Format(s) : PDF
Éditeur : Springer
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147,69
Télécharger le livre :  High-Performance Energy-Efficient Microprocessor Design
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High-Performance Energy-Efficient Microprocessor Design


Ram K. Krishnamurthy , Vojin G. Oklobdzija


Microprocessors of today contain close to a billion transistors, while achieving the performance of super-computers just a decade ago. Designing such processors takes hundreds of people organized into large teams. High Performance Energy Efficient Microprocessor Design...

Parution : 2007-04-27
Format(s) : PDF
Éditeur : Springer
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105,49
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Routing Congestion in VLSI Circuits


Sachin Sapatnekar , Prashant Saxena , Rupesh S. Shelar


With dramatic increases in on-chip packing densities, routing congestion has become a major problem in integrated circuit design, impacting convergence, performance, and yield, and complicating the synthesis of critical interc- nects. The problem is especially acute as...

Parution : 2007-04-27
Format(s) : PDF
Éditeur : Springer
J'achète
105,49
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