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Télécharger le livre :  Diagnostic Electron Microscopy of Tumours

Diagnostic Electron Microscopy of Tumours


Feroze N. Ghadially


Diagnostic Electron Microscopy of Tumors, Second Edition is a guide on how to employ electron microscopy techniques in making evaluation on tumor biopsies. This edition aims to serve as a source of information, references, and electron micrographs for the practicing...


Parution : 2017-05-17
Télécharger le livre :  Optofluidics, Sensors and Actuators in Microstructured Optical Fibers

Optofluidics, Sensors and Actuators in Microstructured Optical Fibers


Stavros Pissadakis , Stefano Selleri


Combining the positive characteristics of microfluidics and optics, microstructured optical fibres (MOFs) have revolutionized the field of optoelectronics. Tailored guiding, diffractive structures and photonic band-gap effects are used to produce fibres with highly...


Parution : 2015-05-19
Télécharger le livre :  Fundamental Principles of Engineering Nanometrology

Fundamental Principles of Engineering Nanometrology


Richard Leach


Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. Richard Leach introduces these techniques to a broad audience of engineers and scientists involved in...


Parution : 2014-05-17
Télécharger le livre :  Quadrupole Mass Spectrometry and Its Applications

Quadrupole Mass Spectrometry and Its Applications


Peter H. Dawson


Quadrupole Mass Spectrometry and Its Applications provides a comprehensive discussion of quadrupoles and their applications. It proceeds from a general explanation of the action of radiofrequency quadrupole fields to the description of their utilization in mass...


Parution : 2013-10-22
Télécharger le livre :  Measurement Evaluation

Measurement Evaluation


A. Boros


The information obtained about a measured object is called ``crude'' measurement information and must be related to the conditions under which the measurement took place. Using ``crude'' measurement information as a starting point, evaluation produces physically...


Parution : 2012-12-02
Télécharger le livre :  Fundamental Principles of Engineering Nanometrology

Fundamental Principles of Engineering Nanometrology


Richard Leach


Fundamental Principles of Engineering Nanometrology provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it...


Parution : 2009-09-03
Télécharger le livre :  Surfaces and their Measurement

Surfaces and their Measurement


David J. Whitehouse


The importance of surface metrology has long been acknowledged in manufacturing and mechanical engineering, but has now gained growing recognition in an expanding number of new applications in fields such as semiconductors, electronics and optics. Metrology is the...


Parution : 2004-07-01
Télécharger le livre :  Measurement Science for Engineers

Measurement Science for Engineers


M. J. Korsten , W Otthius , Paul Regtien , F. Van Der Heijden


This volume, from an international authority on the subject, deals with the physical and instrumentation aspects of measurement science, the availability of major measurement tools, and how to use them.This book not only lays out basic concepts of electronic measurement...


Parution : 2004-06-01
Télécharger le livre :  Advanced Techniques for Assessment Surface Topography

Advanced Techniques for Assessment Surface Topography


Liam Blunt , Xiang Jiang


This publication deals with the latest developments in the field of 3D surface metrology and will become a seminal text in this important area. It has been prepared with the support of the European Community’s Directorate General XII and represents the culmination of...


Parution : 2003-06-01
Télécharger le livre :  Three Dimensional Surface Topography

Three Dimensional Surface Topography


Liam Blunt , Ken J Stout


This fully illustrated text explains the basic measurement techniques, describes the commercially available instruments and provides an overview of the current perception of 3-D topography analysis in the academic world and industry, and the commonly used 3-D parameters...


Parution : 2000-06-01
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