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Extreme Statistics in Nanoscale Memory Design


Rob A. Rutenbar , Amith Singhee


Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the...

Parution : 2010-09-09
Format(s) : ePub
Éditeur : Springer
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