Détails
Marque
Collection
n.c
Parution
2025-02-10
Pages
317 pages
EAN papier
9783031829666
Langue
Anglais
Informations ebook
EAN PDF
9783031829673
Prix
169,59 €
En savoir plus
Nb pages copiables 3
Nb pages imprimables 31
Taille du fichier 27904 Ko
EAN EPUB
9783031829673
Prix
169,59 €
En savoir plus
Nb pages copiables 3
Nb pages imprimables 31
Taille du fichier 128154 Ko
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Auteur(s) du livre


Dr. RAJENDER SINGH currently serves as a scientific officer in the Electron Microscopy Section at the Department of CIL/SAIF, Panjab University, Chandigarh, India. With nearly 13 years of experience in the field of electron microscopy, Dr. Singh is a seasoned expert in many facets of TEM sample preparation. His role involves analyzing diverse samples from material science and life science areas across India, utilizing cutting-edge instruments such as TEM (H7500, 120KV), HRTEM with SAED, EDS (Oxford), and FESEM with EDS (Hitachi SU8010). Dr. Singh is not only responsible for the operation of sophisticated instruments but also leads training modules for students at various academic levels, focusing on TEM, HRTEM, SEM, FESEM, ultramicrotome, and Critical Point Dryer (CPD) instruments.

His technical skills span handling HRTEM JEOL 2100 Plus independently, performing maintenance for various TEM models, and interpreting STEM bright field and dark field imaging.

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