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Télécharger le livre : Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

Jacopo Franco , Guido Groeseneken , Ben Kaczer

Due to the ever increasing electric fields in scaled CMOS devices, reliability is becoming a showstopper for further scaled technology nodes. Although several groups have already demonstrated functional Si channel devices with aggressively scaled Equivalent Oxide...

Parution : 2013-10-19
Format(s) : ePub
Éditeur : Springer
Collection : Springer Series in Advanced Microelectronics
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96,29 €

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