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This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in...
This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of...
Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their...
Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits have been found to be...
Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The continuous...
As many circuits and applications now enter the Gigahertz frequency range, accurate digital timing measurements have become crucial in the design, verification, characterization, and application of electronic circuits. To be successful in this endeavour, an engineer...
In the early to mid-1990's while working at what was then Motorola Se- conductor, business changes forced my multi-hundred dollar microprocessor to become a tens-of-dollars embedded core. I ran into first hand the problem of trying to deliver what used to be a whole...
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related toSOC testing, discusses the modeling granularity and the implementation into...
Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which...
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