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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

Laurent Artola , Cristina Meinhardt , Ricardo Reis , Alexandra Zimpeck

This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error...